2015 – CPG

High Performance Spring Probes for In-circuit and Functional PCBA Test

25. November 2015

ECTâ€™s EDGE probe combines leading architecture and materials for lead free applications

Everett Charles Technologiesâ€™ (ECT) EDGE probes are the answer to poor first pass yield, short probe life and excessive cleaning cycles, when caused by oxide layer build up or debris, particularly in lead free applications. In volume manufacturing the impact worsens as cycle count increases and elevated levels of debris are transferred to the probe tips.Â In many applications effective electrical contact is compromised.

Everett Charles Technologies to exhibit at BIOMEDevice Show 2015

18. November 2015

Leading Connector Solutions Meeting Challenging Requirements

Everett Charles Technologies (ECT) will exhibit its leading Compliant Connector Solutions at the upcoming BIOMEDevice Show scheduled to take place December 2 -3, 2015 at the San Jose Exhibition Center, California.

ECT offers a comprehensive portfolio of compliant connectors including customized solutions. ECTâ€™s â€œstandard connectorsâ€ are based on a highly flexible architecture, which facilitates cost-efficient configurations for customer requirements. ECT compliant connectors meet the highest quality standards and have proven superior durability in high life cycle applications.

LFRE Plated Probes: Substantial Improvement of Test Cell Uptime on PCBA In-circuit Test Applications

26. October 2015

ECTs proprietary LFRE plating has been proven to significantly extend probe life and time between cleaning cylces

Everett Charles Technologies (ECT) has proven the exceptional performance of LFRE spring probe products in a challenging evaluation at a major automotive electronics supplier with global manufacturing facilities. The ECT LFRE probes, which were used in an in-circuit test fixture, tripled insertion life and reduced cleaning frequency by a factor of 10 compared to the original set up.

New ECT Accordionâ„¢ Technology Provides Reliable Contact in Harsh Environments

8. October 2015

Patented interconnect solution offers unprecedented cost and reliability advantages for high insertion count applications

Everett Charles Technologies (ECT) has been supplying spring probes for over 50 years. ECT leverages this industry leading experience for unique, customer focused solutions to the most challenging connector requirements. Accordionâ„¢ is a patented contact technology from ECT that targets high reliability applications. Itâ€™s well suited for demanding environments found in the military, aerospace and medical markets. Recently the ECT Accordion contact has been selected as interconnect platform solution for a critical signal and power transmission application by a tier one military contractor.

Meeting the Challenges of Cost-Efficient Testing High-End Digital Devices

27. August 2015

Everett Charles Technologies introduces new member of the ZIP probes family: Z-080YHJ

Everett Charles Technologies (ECT) launched a new member of the versatile ZIPâ„¢ semiconductor test probe family. The Z-080YHJ is designed to meet the many challenges associated with testing High End Digital (HED) devices. ZIP probes are a cost effective solution that provide excellent mechanical reliability and electrical performance.

Reliable Probes for Most Challenging High Current Testing

3. August 2015

Everett Charles Technologies Introduces HC500F High Current Probe

Everett Charles Technologies (ECT) introduces the latest addition to our versatile family of high current probes; the HC500F. The HC500F is rated at 150 Amps DC and is designed for the most challenging applications in a broad range of industrial test applications including transportation, automotive, power grid, military and PCB test.

ECTâ€™s Launches New Probe Family for RF Signal Testing of PCBAs and Industrial Applications

30. April 2015

CSP-40 significantly reduces cost per insertion with best best electrical performance at competitive pricing

Everett Charles Technologies (ECT) recently launched a new line of high frequency test probes for the PCBA and industrial test markets. The
CSP-40 high frequency probe family offers high reliability and excellent electrical performance at competitive pricing and significantly reduces the cost per test insertion.

ECTâ€™s ZIPâ„¢ Probe for Semiconductor Test Exceeds Customer Expectations

8. April 2015

ZIP probes built from HyperCoreâ„¢ base material proved superior performance in high volume production

Everett Charles Technologies (ECT) successfully passed a two month evaluation of ZIP probes using the HyperCore material option in a high volume production environment at a large OSAT in Singapore. The ZIP probe exceeded the critical first pass yield expectations and beat the target for a 500 k insertions life time by over 20%.

ZIP is one of several semiconductor test probe families offered by ECT. For this evaluation the ZIP probe was deployed in a quad-site test set-up for a 250 BGA package with 0.8 mm pitch for an Ethernet/MoCA (Multimedia over Coax Alliance) end application. The test was done at ambient and hot (85Â°C) conditions.

Meeting the Requirements of Lead Free PCBA Testing

9. January 2015

Everett Charles Technologies Enhances LFRE Product Line: Lead Free Long Travel Probes (LFLT)

Everett Charles Technologies (ECT) extended the probe offering (LFRE probes) for lead free PCB in-circuit and functional test applications to include long-travel probes (LFLT probes). ECT LFLT probes have almost twice the compliance as standard length probes. The new long-travel probes meet the need for reliable contact solutions for lead free dual-stage in-circuit test fixtures.