The precisely-controlled physical and electrical characteristics of Everett Charles Technologies (ECT) RF high frequency test probes make them an ideal port-extending accessory for network analyzers and time domain reflectometers. The RF center conductor system is captivated for maximum reliability. The incorporated spring probes in the open architecture format are able to accommodate a wide range of physical circuit topologies. This alleviates the need for special geometry contact pads on the circuit under test.
ECT recently launched a new line of high frequency test probes for the PCBA and industrial test markets. The CSP-30 high frequency probe family offers high reliability and excellent electrical performance at competitive pricing and significantly reduces the cost per test insertion.
Designed in ECT’s proven coaxial architecture the CSP-30 probe provides an instrumentation-quality 50 ohm impedance interface for broadband RF measurements up to 20 GHz. The physical and electrical characteristics are precisely controlled to ensure accurate and repeatable results. The RF center conductor system is captivated for maximum reliability.
The CSP-30 line is offered in standard plunge-to-board, RF connector and RF switch configurations, which are off-the-shelf. It can also be customized to meet specific contact pattern requirements. The CSP-30 probe can also be configured to mate with industry standard connectors such as: SMP, SMA, SMB and RF switches.