https://ect-cpg.com/wp-content/uploads/2018/09/ECT-Contact-Products-180x180.jpg 180 180 Antoinette McKinley https://ect-cpg.com/wp-content/uploads/2019/12/EverettCharles-Logo_Cohu_web.jpg Antoinette McKinley2015-08-27 09:29:442019-04-08 09:31:07Meeting the Challenges of Cost-Efficient Testing High-End Digital Devices
Meeting the Challenges of Cost-Efficient Testing High-End Digital Devices
Everett Charles Technologies introduces new member of the ZIP probes family: Z-080YHJ
Everett Charles Technologies (ECT) launched a new member of the versatile ZIP™ semiconductor test probe family. The Z-080YHJ is designed to meet the many challenges associated with testing High End Digital (HED) devices. ZIP probes are a cost effective solution that provide excellent mechanical reliability and electrical performance.