Solar Panel Testing
- Effective
- Reliable solution for non-destructive electrical contacting
- For standard or custom applications
Bus Bar Contact Solutions
Polysilicon or Thin Film Contact Solutions
During the production of solar photovoltaic (PV) products, there are many instances where it is desirable to make non-destructive temporary electrical contact for the purposes of measuring current and voltage. Spring probe technology is an ideal solution to provide electrical connections to obtain I-V curve measurements or providing reliable contact for your challenging high current or low voltage connections.
As alternative energy technologies become more mainstream, ECT is committed to providing effective and reliable solutions for test and measurement of solar panels.
Whether you are making contact directly with silicon/thin-film circuitry, or the bus bar of your PV device, ECT offers a wide range of sizes, tip styles, and spring forces to accommodate your specific application.
The probes are specifically designed to yield a linear force – compression relationship as the probe is actuated. This minimizes potentially harmful jumps or steps in force.
Requirements
- Non-destructive temporary electrical contact
- Linear force – compression relationship
- For obtaining I-V curve measurements
- For challenging high current connections
- For low voltage connections
