High Performance Spring Probes for In-circuit and Functional PCBA Test
ECT’s EDGE probe combines leading architecture and materials for lead free applications
Everett Charles Technologies’ (ECT) EDGE probes are the answer to poor first pass yield, short probe life and excessive cleaning cycles, when caused by oxide layer build up or debris, particularly in lead free applications. In volume manufacturing the impact worsens as cycle count increases and elevated levels of debris are transferred to the probe tips. In many applications effective electrical contact is compromised.