• Key Visual

ICT / FCT Probes

Key Features

  • Decades of experience
  • Proprietary base materials and coatings
  • Innovative designs
  • Optimized electrical path
in-circuit test functional test probes

ICT / FCT Probes Product Line

LFRE
LFRE-25H-10 probe
POGO
POGO-25J-4 probe
MTX
MTX-50 probe
MXLT
MXLT-39 probe
LFLT
LFLT-25 probe
LTP
LTP-25 probe
BTP
BTP-25
BPLT
BPLT-25 probe
GSP-2B
GSP-2B probe
RSP-2T
RSP-2T probe

FRP-25T
FRP-25T probe
SIP-90
SIP-90-2 probe
GPP-95-2
GPP-95
DER
DER probe
BMP
BMP-3

Everett Charles Technologies offers a comprehensive selection of pitch options, tip geometries, and platings to ensure an optimized probe solution for every application.  ECT’s In-circuit and functional test product lines, which include LFRE and PogoPlus Series, address the unique demands of loaded board and vacuum fixture applications. Most probes feature an enhanced version of the legendary bias-ball design to virtually eliminate “false opens”; proprietary metal plating processes for higher conductivity; and precision MicroSharp steel tips for long-lasting durability. A full range of sizes accommodates products with mixed test center requirements.

ECT’s revolutionary PogoPlus with Biasing Ball technology probes eliminate probe-induced false opens, saving you the time, money, and trouble of needless product retesting.  The unrivaled electrical performance of the PogoPlus is due to the interaction between the spring, captured ball, and plunger, which forces the plunger into continuous contact with the barrel wall at all times. The result is uninterrupted electrical continuity and low overall resistance that can’t be equaled by any other “high performance” probe.

The PogoPlus is also designed to be the world’s most durable probe with features like optional stainless-steel MicroSharp tips, a larger spring volume, and enhanced pointing precision.

LFRE plated probes from Everett Charles Technologies consistently outperform traditional Gold plated probes. LFRE plated probes provide customers with a proven high volume production test solution for lead free PCBA test applications.  They ensure reliable contact and longer life for probes in in-circuit test fixtures. In addition to improved tip ware, LFRE plated probes are less prone to solder transfer.

Besides the leading expertise in materials and platings, probes for lead free applications leverage ECT’s probe design and fabrication knowledge. The LFRE plated probes incorporate ECT’s proven PogoPlus bias ball design and double roll close process.  Both of which contribute to making sustainable reliable contact with PCB targets. Lead free plating is featured on ECT’s industry-standard PogoPlus LFRE series, Metrix, and on Long Travel probes.

Applications

  • In-circuit test
  • Functional test
  • Lead free
  • Fine pitch test centers
  • Dual or single stage

High performance probes dedicated to in-circuit and functional test

  • Best yield
  • Best cost of test
  • Long life