October 2014 – CPG

ECT-Contact-Products-180x180

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ECT Improving Performance and Reliability for PCBA Test and Industrial Applications

28. October 2014

Everett Charles Technologies Launches l40 Tip Style

Everett Charles Technologies (ECT) launches the new l40 tip style. The innovative geometry of the l40 tip ensures best yield and reliability and overcomes the challenges of contacting lead free solder or OSP treated copper.

Lead free solder and OSP treated copper present a harder or more abrasive contact surface causing excessive plating and probe tip wear. The l40â€˜s advanced off axis tip geometry machining methodology was designed to improve tip wear and resistance to tip fracturing. l40 tip style offers a more robust probe design and a longer tip life. The l40â€˜s straight shaft lance with a 40Â° facet combines the penetration capability of a sharp tip probe while providing added material behind the tip to increase strength.

ECT-Contact-Products-180x180

<img loading="lazy" width="180" height="180" src="/wp-content/uploads/2018/09/ECT-Contact-Products-180x180.jpg" class="wp-image-5901 avia-img-lazy-loading-5901 attachment-square size-square wp-post-image" alt="ECT-Contact-Products-180x180" decoding="async" srcset="/wp-content/uploads/2018/09/ECT-Contact-Products-180x180.jpg 180w, /wp-content/uploads/2018/09/ECT-Contact-Products-180x180-80x80.jpg 80w, /wp-content/uploads/2018/09/ECT-Contact-Products-180x180-36x36.jpg 36w, /wp-content/uploads/2018/09/ECT-Contact-Products-180x180-120x120.jpg 120w" sizes="(max-width: 180px) 100vw, 180px" />

ECT Launches Versatile RF Probes Semiconductor Test

9. October 2014

Z1 and Z0 Probes leverages ECTâ€˜s flat technology to achieve the next level performance

Everett Charles Technologies (ECT) launches two new members of the ZIPâ„¢ probe family designed to meet signal integrity challenges driven by the ever increasing speed of semiconductors devices. Z0 and Z1 probes are a cost effective solution that provide excellent mechanical reliability and electrical performance.