ECT-Contact-Products-180x180

Reliable Probes for Most Challenging High Current Testing

Everett Charles Technologies Introduces H375 High Current Probes

Everett Charles Technologies (ECT) introduces the latest addition to our versatile family of high current probes; the HC375. The HC375 is rated at 100 Amps DC and is designed for the most challenging applications in a broad range of industrial test including transportation, automotive, power grid, military and PCB test.

Read more

ECT-Contact-Products-180x180

ECT Improving Performance and Reliability for PCBA Test and Industrial Applications

Everett Charles Technologies Launches l40 Tip Style

Everett Charles Technologies (ECT) launches the new l40 tip style. The innovative geometry of the l40 tip ensures best yield and reliability and overcomes the challenges of contacting lead free solder or OSP treated copper.

Lead free solder and OSP treated copper present a harder or more abrasive contact surface causing excessive plating and probe tip wear. The l40‘s advanced off axis tip geometry machining methodology was designed to improve tip wear and resistance to tip fracturing. l40 tip style offers a more robust probe design and a longer tip life. The l40‘s straight shaft lance with a 40° facet combines the penetration capability of a sharp tip probe while providing added material behind the tip to increase strength.

Read more

ECT-Contact-Products-180x180

ECT Launches Versatile RF Probes Semiconductor Test

Z1 and Z0 Probes leverages ECT‘s flat technology to achieve the next level performance

Everett Charles Technologies (ECT) launches two new members of the ZIP™ probe family designed to meet signal integrity challenges driven by the ever increasing speed of semiconductors devices. Z0 and Z1 probes are a cost effective solution that provide excellent mechanical reliability and electrical performance.

Read more

ECT-Contact-Products-180x180

Everett Charles Technologies Releases HyperCore™ Material to Full ZIP™ Probe Product Line

Premium Performance for Semiconductor Test Based on Superior Probe Material

Everett Charles Technologies (ECT) releases the HyperCore™ material to the full ZIP™ product line. ZIP™ is an ECT single probe family that is dedicated to semiconductor test applications. HyperCore™ is an innovative, non-plated and homogenous probe material optimized for longer probe life, longer cleaning cycles and reliable contact.

Read more

ECT-Contact-Products-180x180

Everett Charles Technologies Expands Line of Battery Probes

CP-2 probe family combines best volume production qualities and cost with design flexibility and fast prototype

Everett Charles Technologies (ECT) recently launched the next generation of Battery Interconnect Probes. The versatile CP-2 probe family is highly flexible and designed to match any performance, cost and assembly requirements.

Read more

ECT-Contact-Products-180x180

Fastest Availability Guaranteed – Spring Probe Supply for Today’s Fast Pace Business

Everett Charles Technologies establishes advanced inventory stocking program for standard spring probes

Everett Charles Technologies (ECT) has established an advanced inventory stocking program for standard spring probes to ensure supply chain reliability and flexibility. ECT fully recognized their customers need to shorten product development times and to react promptly to changing demand.

Read more

ECT-Contact-Products-180x180

High Reliability Combined with Longest Life Cycle

Everett Charles Technologies releases new high reliability standard connector family

Everett Charles Technologies (ECT) introduces a new modular connector family for a broad range of applications in the electrical market. These connectors are dedicated to provide highest reliability  and life cycle of more than 100k cycles and therefore are the superior solution for any high cycle deployment. ECT leverages the experience with the existing high performance contact sto offer these new modular connectors. The adjustable architecture ensures both, economies of scale and customized fit to existing environment.

Read more