ECT Launches Versatile RF Probes Semiconductor Test
Z1 and Z0 Probes leverages ECT‘s flat technology to achieve the next level performance
Everett Charles Technologies (ECT) launches two new members of the ZIPâ„¢ probe family designed to meet signal integrity challenges driven by the ever increasing speed of semiconductors devices. Z0 and Z1 probes are a cost effective solution that provide excellent mechanical reliability and electrical performance.