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ECT’s ZIP™ Z0-040 Spring Probe Increased Life by 500% in Head to Head Comparison

Z0-040RHJ High Performance Spring Probe for semiconductor test out performs the competition in a challenging application contacting NiPd pads

Everett Charles Technologies (ECT) successfully won a head-to-head evaluation using Z0-040 probes made with HyperCore™ material in a high volume production environment at a large Asian OSAT. The Z0 probes reached 250k insertions, more than a 500% increase of the probe life compared to the competitor’s spring probe while exceeding first pass yield expectations.

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ECT’s BTP/BTLP Series Supports Bead Probe Testing of PCBs

Leveraging ECT’s Expertise and Innovation for this Advanced PCB Test Approach

Everett Charles Technologies (ECT) has developed a series of spring probes, BTP and BPLT, specifically for bead probe test. Combining well-established design and plating principles with an innovative tip design to fully support the special requirements for contacting bead probes.

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Choosing the Right ECT Spring Probe for ICT and FCT Testing

How do I select Base Material / Plating, Spring Force, and Tip Selection?

In the world of spring probes, choices abound when it comes to selecting materials and platings for plungers, barrels and springs. Choosing the right options can greatly impact yield, probe life and cleaning frequency.

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