ECT’s ZIP™ Z0 RF Spring Probe for Semiconductor Test Exceeds Customer Expectations
ZIP probes built from HyperCoreâ„¢ base material provides superior performance in high volume production
Everett Charles Technologies (ECT) successfully won a head-to-head evaluation of ZIP probes with the HyperCore™ material option in a high volume production environment at a large Chinese OSAT. The Z0 probes reached 450k insertions more than doubling the life of the competitor’s spring probe while exceeding first pass yield expectations.
