August 2015 – CPG

ECT-Contact-Products-180x180

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Meeting the Challenges of Cost-Efficient Testing High-End Digital Devices

27. August 2015

Everett Charles Technologies introduces new member of the ZIP probes family: Z-080YHJ

Everett Charles Technologies (ECT) launched a new member of the versatile ZIPâ„¢ semiconductor test probe family. The Z-080YHJ is designed to meet the many challenges associated with testing High End Digital (HED) devices. ZIP probes are a cost effective solution that provide excellent mechanical reliability and electrical performance.

ECT-Contact-Products-180x180

<img loading="lazy" width="180" height="180" src="/wp-content/uploads/2018/09/ECT-Contact-Products-180x180.jpg" class="wp-image-5901 avia-img-lazy-loading-5901 attachment-square size-square wp-post-image" alt="ECT-Contact-Products-180x180" decoding="async" srcset="/wp-content/uploads/2018/09/ECT-Contact-Products-180x180.jpg 180w, /wp-content/uploads/2018/09/ECT-Contact-Products-180x180-80x80.jpg 80w, /wp-content/uploads/2018/09/ECT-Contact-Products-180x180-36x36.jpg 36w, /wp-content/uploads/2018/09/ECT-Contact-Products-180x180-120x120.jpg 120w" sizes="(max-width: 180px) 100vw, 180px" />

Reliable Probes for Most Challenging High Current Testing

3. August 2015

Everett Charles Technologies Introduces HC500F High Current Probe

Everett Charles Technologies (ECT) introduces the latest addition to our versatile family of high current probes; the HC500F. The HC500F is rated at 150 Amps DC and is designed for the most challenging applications in a broad range of industrial test applications including transportation, automotive, power grid, military and PCB test.