Automated Test
Mature global installed base.
ECT offers an extensive catalog of spring probes to meet a range of electrical requirements including low resistance, high current, and signal integrity. These probes can then be mounted directly to a connecting board or housed in plastic, offering versatility in board-to-board connections.
VG modular interface solutions facilitate standardizing custom tester interfaces. The VG platform is easily configured for new deployments, and update-able for tester life cycle support. Stocked options and a wide global installed base make VG safe for deployment and replication. Tester resource interconnects are available for high power, high frequency, analog and digital, as well as common connector pass-through options.
Custom ATE interface solutions are engineered to meet specific tester electro-mechanical requirements. ECTi design and build process result in solutions with predicable performance in high volume, ideal for tester interface arrays. Instruments requiring high density, low CRES/high current are supported by careful materials selection, plating and engineered internal contact biasing.
Cost downs for complex test system connectors are achievable through machining to mold conversion. ECTi experience in project management and quality system removes risk when making molding investments.
Discrete POGO’s available for DUT contact with thousands of designs available. Custom DUT interconnects available to meet unique application needs.
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