• Key Visual

Semiconductor Probes

Key Features

  • Decades of experience
  • Proprietary base materials and coatings
  • Innovative designs
  • Optimized electrical plan
semiconductor probes

Semiconductor Probes Product Line

Bantam Series
Bantam-series probes
CSP Series
CSP-series probes
SCP Mini-Mite Series
SCP-series probes
ZIP Probe Series
ZIP-series probes

Semiconductor probes from Everett Charles Technologies (ECT) are optimized for the best cost of test. Based on decades of experience ECT offers a most comprehensive portfolio of probes dedicated to semiconductor test applications including RF high frequency, high current, fine pitch, and lead-free.

ECT has developed proprietary architectures, base materials, and coatings to ensure the best first-pass yield in the semiconductor test. ECT’s probes are designed for the lowest resistance and best contact force requirements to support the optimum electrical path.

High performance semiconductor probes dedicated to test

  • Best yield
  • Best cost of test