Entries by Anna Behringer

ECT’s ZIP™ Z0 RF Spring Probe for Semiconductor Test Exceeds Customer Expectations

ZIP probes built from HyperCore™ base material provides superior performance in high volume production Everett Charles Technologies (ECT) successfully won a head-to-head evaluation of ZIP probes with the HyperCore™ material option in a high volume production environment at a large Chinese OSAT. The Z0 probes reached 450k insertions more than doubling the life of the […]

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New ECT Accordion™ Technology Provides Reliable Contact in Harsh Environments

Patented interconnect solution offers unprecedented cost and reliability advantages for high insertion count applications Everett Charles Technologies (ECT) has been supplying spring probes for over 50 years. ECT leverages this industry leading experience for unique, customer focused solutions to the most challenging connector requirements. Accordion™ is a patented contact technology from ECT that targets high […]

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